Analiza SMART dysku twardego.

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gooru2
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Analiza SMART dysku twardego.

Post autor: gooru2 »

Ostatnie 2 dni zacząłem dostawać maile o błędach w SMART dysku siędzącego w NASie. Nie znam dokładnie wartości jakie predystynują do wysłania dysku na gwarancję. W takim razie czy od razu robić kopie, czy na razie mogę spać spokojnie.

Kod: Zaznacz cały

smartctl 5.42 2011-10-20 r3458 [armv5tel-linux-2.6.31.8.duov2] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Device Model:     ST3000DM001-1CH166
Serial Number:    Z1F13T7P
LU WWN Device Id: 5 000c50 04e3348c5
Firmware Version: CC43
User Capacity:    3,000,592,982,016 bytes [3.00 TB]
Sector Sizes:     512 bytes logical, 4096 bytes physical
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 4
Local Time is:    Thu Jun 19 21:27:56 2014 PDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		(  592) seconds.
Offline data collection
capabilities: 			 (0x73) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					No Offline surface scan supported.
					Self-test supported.
					Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   1) minutes.
Extended self-test routine
recommended polling time: 	 ( 255) minutes.
Conveyance self-test routine
recommended polling time: 	 (   2) minutes.
SCT capabilities: 	       (0x3085)	SCT Status supported.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   110   094   006    Pre-fail  Always       -       234454854
  3 Spin_Up_Time            0x0003   092   092   000    Pre-fail  Always       -       0
  4 Start_Stop_Count        0x0032   100   100   020    Old_age   Always       -       45
  5 Reallocated_Sector_Ct   0x0033   100   100   036    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000f   067   051   030    Pre-fail  Always       -       98886439672
  9 Power_On_Hours          0x0032   087   087   000    Old_age   Always       -       12049
 10 Spin_Retry_Count        0x0013   100   100   097    Pre-fail  Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   020    Old_age   Always       -       45
183 Runtime_Bad_Block       0x0032   100   100   000    Old_age   Always       -       0
184 End-to-End_Error        0x0032   100   100   099    Old_age   Always       -       0
187 Reported_Uncorrect      0x0032   001   001   000    Old_age   Always       -       239
188 Command_Timeout         0x0032   100   100   000    Old_age   Always       -       0
189 High_Fly_Writes         0x003a   098   098   000    Old_age   Always       -       2
190 Airflow_Temperature_Cel 0x0022   060   054   045    Old_age   Always       -       40 (Min/Max 39/42)
191 G-Sense_Error_Rate      0x0032   100   100   000    Old_age   Always       -       0
192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always       -       45
193 Load_Cycle_Count        0x0032   100   100   000    Old_age   Always       -       363
194 Temperature_Celsius     0x0022   040   046   000    Old_age   Always       -       40 (0 21 0 0 0)
197 Current_Pending_Sector  0x0012   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0010   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   200   200   000    Old_age   Always       -       0
240 Head_Flying_Hours       0x0000   100   253   000    Old_age   Offline      -       101661875908368
241 Total_LBAs_Written      0x0000   100   253   000    Old_age   Offline      -       12998683041
242 Total_LBAs_Read         0x0000   100   253   000    Old_age   Offline      -       16926323121

SMART Error Log Version: 1
ATA Error Count: 239 (device log contains only the most recent five errors)
	CR = Command Register [HEX]
	FR = Features Register [HEX]
	SC = Sector Count Register [HEX]
	SN = Sector Number Register [HEX]
	CL = Cylinder Low Register [HEX]
	CH = Cylinder High Register [HEX]
	DH = Device/Head Register [HEX]
	DC = Device Command Register [HEX]
	ER = Error register [HEX]
	ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 239 occurred at disk power-on lifetime: 12022 hours (500 days + 22 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 00 ff ff ff 0f  Error: UNC at LBA = 0x0fffffff = 268435455

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 00 00 ff ff ff 4f 00      06:19:36.254  READ FPDMA QUEUED
  2f 00 01 10 00 00 00 00      06:19:36.217  READ LOG EXT
  60 00 00 ff ff ff 4f 00      06:19:33.354  READ FPDMA QUEUED
  2f 00 01 10 00 00 00 00      06:19:33.316  READ LOG EXT
  60 00 00 ff ff ff 4f 00      06:19:30.361  READ FPDMA QUEUED

Error 238 occurred at disk power-on lifetime: 12022 hours (500 days + 22 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 00 ff ff ff 0f  Error: UNC at LBA = 0x0fffffff = 268435455

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 00 00 ff ff ff 4f 00      06:19:33.354  READ FPDMA QUEUED
  2f 00 01 10 00 00 00 00      06:19:33.316  READ LOG EXT
  60 00 00 ff ff ff 4f 00      06:19:30.361  READ FPDMA QUEUED
  60 00 00 ff ff ff 4f 00      06:19:30.361  READ FPDMA QUEUED
  60 00 80 ff ff ff 4f 00      06:19:30.361  READ FPDMA QUEUED

Error 237 occurred at disk power-on lifetime: 12022 hours (500 days + 22 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 00 ff ff ff 0f  Error: UNC at LBA = 0x0fffffff = 268435455

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 00 00 ff ff ff 4f 00      06:19:30.361  READ FPDMA QUEUED
  60 00 00 ff ff ff 4f 00      06:19:30.361  READ FPDMA QUEUED
  60 00 80 ff ff ff 4f 00      06:19:30.361  READ FPDMA QUEUED
  60 00 80 ff ff ff 4f 00      06:19:30.361  READ FPDMA QUEUED
  60 00 80 ff ff ff 4f 00      06:19:30.361  READ FPDMA QUEUED

Error 236 occurred at disk power-on lifetime: 12022 hours (500 days + 22 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 00 ff ff ff 0f  Error: UNC at LBA = 0x0fffffff = 268435455

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 00 00 ff ff ff 4f 00      06:19:27.275  READ FPDMA QUEUED
  61 00 00 ff ff ff 4f 00      06:19:27.275  WRITE FPDMA QUEUED
  61 00 20 ff ff ff 4f 00      06:19:27.275  WRITE FPDMA QUEUED
  61 00 c0 ff ff ff 4f 00      06:19:27.275  WRITE FPDMA QUEUED
  61 00 80 ff ff ff 4f 00      06:19:27.275  WRITE FPDMA QUEUED

Error 235 occurred at disk power-on lifetime: 12022 hours (500 days + 22 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 00 ff ff ff 0f  Error: WP at LBA = 0x0fffffff = 268435455

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  61 00 00 ff ff ff 4f 00      06:19:24.922  WRITE FPDMA QUEUED
  61 00 20 ff ff ff 4f 00      06:19:24.922  WRITE FPDMA QUEUED
  61 00 c0 ff ff ff 4f 00      06:19:24.922  WRITE FPDMA QUEUED
  61 00 80 ff ff ff 4f 00      06:19:24.921  WRITE FPDMA QUEUED
  61 00 50 ff ff ff 4f 00      06:19:24.921  WRITE FPDMA QUEUED

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Short offline       Completed without error       00%         1         -
# 2  Short offline       Completed without error       00%         0         -

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
 
bear7
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Re: Analiza SMART dysku twardego.

Post autor: bear7 »

gooru2 pisze:W takim razie czy od razu robić kopie, czy na razie mogę spać spokojnie.
Jeżeli jeszcze nie masz kopii, to znaczy to jedynie tyle, że nie są to dla Ciebie ważne pliki i ich stać Cię na ich utratę.
gooru2 pisze:Nie znam dokładnie wartości jakie predystynują do wysłania dysku na gwarancję.
W tym przypadku, najlepiej zapoznać się z warunkami gwarancji lub skontaktować się z producentem sprzętu.

Co prawda, dysk przechodzi weryfikację:

Kod: Zaznacz cały

SMART overall-health self-assessment test result: PASSED
Ale te informacje, mogą być niepokojące:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 110 094 006 Pre-fail Always - 234454854
3 Spin_Up_Time 0x0003 092 092 000 Pre-fail Always - 0
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 067 051 030 Pre-fail Always - 98886439672
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
Sprawdź, czy producent tego dysku, udziela pomocy technicznej przez telefon lub email i zapytaj, czy możesz podesłać wyniki SMART testu do analizy. Nie zaszkodzi spróbować.
O pomoc pytaj a forum, a nie przez PW.
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rom
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Re: Analiza SMART dysku twardego.

Post autor: rom »

także = też
tak że = więc
gooru2
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Re: Analiza SMART dysku twardego.

Post autor: gooru2 »

Najważniejsze dane są z automatu przerzucane do chmury. Oprócz tego spora część danych jest kopiowana na drugi mniejszy dysk. Ale to również istotne dane. Odpuszczam jedynie multimedia.
Właśnie te prefaille mnie zaniepokoiły.
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